TQ-60-X - Ultrasonic flaw detector
Acoustic flaw detectors
The TQ-60-X is a high-performance ultrasonic flaw detector designed for simultaneous operation with two 64-channel phased array probes and a variety of scanners, including roller scanners and combined PA+TOFD scanners. With an S-scan refresh rate of 100 Hz, it enables high-speed weld inspection from both sides at up to 6–9 meters per minute.
The device also supports up to two TOFD channels, meeting global inspection standards. A classic flaw detection mode is included. An advanced software package provides automated data collection, image processing, and 3D visualization for detailed evaluation.
Application
- Weld inspection using phased array and TOFD techniques
- Automated scanning with 2D scanners
- Defect detection in metal structures
- High-speed, high-resolution inspection of complex geometries
- Post-scan 3D analysis and reporting
Operational advantages
- Supports full weld geometry definition, including wall thickness differences, cap bead dimensions, and heat-affected zone width (image 1)
- Universal, clearly structured probe positioning on the scanner ensures precise data alignment into a unified scan (image 2)
- Up to 4 inspection groups can be configured for each phased array probe
- High-resolution imaging with multiple scanning types:
– Classic S-scan
– Fixed-angle L-scan
– Combined LS-scan (compound S-scan with beam swing and aperture movement
Probes characteristics
Phased array (PA) channels:
- Generator configuration: 16:128 (optional 32:128)
- Excitation voltage: ±75 V
- Pulse type: Radio pulse
- Synchronization: by position encoder or by time
- Gain: 0–80 dB (0.5 dB step)
- Operating frequency range: 500 kHz – 20 MHz
- Sampling rate: 100 MHz
- ADC resolution: 10 bits
- Data resolution: 16-bit
- Signal recording: Digital recording of each waveform
- Maximum A-scan length: up to 10,000 points
- Pulse repetition frequency: Up to 20 kHz
- Number of focal laws: up to 1024
- Sensitivity leveling: 2D by angle and depth (TCG range 60 dB, 32 points with slope up to 50 dB/μs)
- Focus types: depth, path, distance, auto
- Decimation: 1:1 / 1:128
Single-element (conventional UT) channels:
- Number of channels: 2 independent
- Excitation voltage: ±200 V
- Operating frequency range: 500 kHz – 20 MHz
- Sampling rate: 100 MHz
- Gain: 0–110 dB (steps: 0.1 / 0.5 / 1 / 2 / 6 dB)
- Processing modes modes: A-scan, B-scan, TOFD
- Connectors: 4 x Lemo 000
Exploitation
- Built-in scan constructor for each group enhances setup flexibility (image 3)
- Real-time and post-scan defect analysis for immediate scanner adjustment (image 4)
Technical specifications
Storage: USB flash or Ethernet (10/100 Mbps)
USB ports: 2 onboard + hub for 5 additional
Data file size: up to 300 MB
Standard scanning speed: 6–9 m/min
Scan length: 5000 measurements
Display: 8.5" TFT, 800x600, contrast mode for sunlight
Power: 2 swappable batteries, up to 12h operation
External power: 220 V AC
Operating temperature range: from -35 °C to +50 °C
Dimensions: 280 × 245 × 100 mm
Weight: 2.5 kg (with battery)
Delivery set
- TQ-60-X flaw detector unit
- 2 rechargeable batteries
- Battery charger
- Power supply (220 V AC)
- USB storage device
- Transport case
- Quick start guide
- Calibration block (optional)
- Software package for PC analysis
- Rugged transport case
